Title :
A MapReduce Approach for SIFT Feature Extraction
Author :
Wei Han ; Yiding Kang ; Yang Chen ; Xueqing Zhang
Author_Institution :
54th Res. Inst., China Electron. Technol. Group Corp., Shijiazhuang, China
Abstract :
SIFT feature extraction is a computationally intensive problem, for the large scale image, which will take a long time to extract SIFT feature. This paper presents a novel approach, based on MapReduce, to accelerate SIFT feature extraction. A MapReduce based SIFT feature extraction model is established, and the original SIFT feature extraction progress is reformed to fit the model. We have implemented the MapReduce based algorithm and evaluated it on a Hadoop cluster. The experimental results show that this approach can extract SIFT feature simultaneously on Hadoop cluster with a good speed up rate.
Keywords :
feature extraction; image processing; transforms; Hadoop cluster; MapReduce approach; MapReduce based algorithm; SIFT feature extraction; computationally intensive problem; scale image; Acceleration; Clustering algorithms; Computational modeling; Computer architecture; Feature extraction; Hardware; Parallel processing; MapReduce; SIFT; big data; feature extraction; hadoop;
Conference_Titel :
Cloud Computing and Big Data (CloudCom-Asia), 2013 International Conference on
Conference_Location :
Fuzhou
Print_ISBN :
978-1-4799-2829-3
DOI :
10.1109/CLOUDCOM-ASIA.2013.22