DocumentCode :
2183128
Title :
Multi-layer grid embeddings
Author :
Aggarwal, Alok ; Klawe, Maria ; Lichtentein, David ; Linial, Nathan ; Wigderson, Avi
fYear :
1985
fDate :
21-23 Oct. 1985
Firstpage :
186
Lastpage :
196
Abstract :
In this paper we propose two new multi-layer grid models for VLSI layout, both of which take into account the number of contact cuts used. For the first model in which nodes "exist" only on one layer, we prove a tight area x (number of contact cuts) = Θ(n2) trade-off for embedding any degree 4 n-node planar graph in two layers. For the second model in which nodes "exist" simultaneously on all layers, we prove a number of bounds on the area needed to embed graphs using no contact cuts. For example we prove that any n-node graph which is the union of two planar subgraphs can be embedded on two layers in O(n2) area without contact cuts. This bound is tight even if more layers and an unbounded number of contact cuts are allowed. We also show that planar graphs of bounded degree can be embedded on two layers in O(n1.6) area without contact cuts. These results use some interesting new results on embedding graphs in a single layer. In particular we give an O(n2) area embedding of planar graphs such that each edge makes a constant number of turns, and each exterior vertex has a path to the perimeter of the grid making a constant number of turns. We also prove a tight Ω(n3) lower bound on the area of grid n-permutation networks.
Keywords :
Area measurement; Circuit faults; Costs; Fabrication; Laboratories; Length measurement; Printed circuits; Semiconductor device measurement; Very large scale integration; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Foundations of Computer Science, 1985., 26th Annual Symposium on
Conference_Location :
Portland, OR, USA
ISSN :
0272-5428
Print_ISBN :
0-8186-0644-4
Type :
conf
DOI :
10.1109/SFCS.1985.37
Filename :
4568142
Link To Document :
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