Probe based antenna measurements up to 325 GHz for upcoming millimeter-wave applications

Author

Gulan, Heiko ; Beer, Sebastian ; Diebold, Sebastian ; Rusch, Christian ; Leuther, A. ; Kallfass, I. ; Zwick, T.

Author_Institution

Inst. fur Hochfrequenztech. und Elektron. (IHE), Karlsruhe Inst. of Technol. (KIT), Karlsruhe, Germany

fYear

2013

fDate

4-6 March 2013

Firstpage

228

Lastpage

231

Abstract

In this paper a probe based measurement setup is presented that allows the characterization of antennas in the frequency-range between 220 GHz and 325 GHz. The radiation pattern, as well as the gain and the return loss of the antenna under test (AUT) can be measured. The limits of the system in terms of accuracy and dynamic range are given. To demonstrate its functionality a 240 GHz patch-antenna on Gallium Arsenide (GaAs) substrate is measured. A comparison between simulation and measurement shows very good agreement.

Keywords

III-V semiconductors; antenna radiation patterns; gallium arsenide; microstrip antennas; millimetre wave antennas; millimetre wave measurement; AUT; GaAs; antenna under test; frequency 220 GHz to 325 GHz; gallium arsenide substrate; millimeter-wave applications; patch-antenna; probe based antenna measurements; radiation pattern; Antenna measurements; Antenna radiation patterns; Gain; Loss measurement; Probes; Radar antennas; Semiconductor device measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Antenna Technology (iWAT), 2013 International Workshop on

Conference_Location

Karlsruhe

Print_ISBN

978-1-4673-2830-2

Electronic_ISBN

978-1-4673-2829-6

Type

conf

DOI

10.1109/IWAT.2013.6518338

Filename

6518338