Title :
Simulation analysis of semiconductor manufacturing with small lot size and batch tool replacements
Author :
Schmidt, Kilian ; Rose, Oliver
Author_Institution :
AMD Saxony LLC, Co. KG, Dresden, Germany
Abstract :
Long cycle times in semiconductor manufacturing represent an increasing challenge for the industry and lead to a growing need of break-through approaches to reduce it. Small lot sizes and the conversion of batch processes to mini-batch or single-wafer processes are widely regarded as a promising means for a step-wise cycle time reduction. However, there is still a lack of comprehensive and meaningful studies. In this paper we present first results of our modeling and simulation assessment. Our simulation analysis shows that small lot size and the replacement of batch tools with mini-batch or single wafer tools are beneficial but lot size reduction lacks persuasive effectiveness if reduced by more than half.
Keywords :
batch processing (industrial); digital simulation; semiconductor device manufacture; batch tool replacements; mini-batch processes; semiconductor manufacturing; simulation analysis; single-wafer processes; step-wise cycle time reduction; Analytical models; Computational modeling; Manufacturing industries; Metrology; Production systems; Sampling methods; Semiconductor device manufacture; Semiconductor device modeling; Virtual manufacturing; Workstations;
Conference_Titel :
Simulation Conference, 2008. WSC 2008. Winter
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-2707-9
Electronic_ISBN :
978-1-4244-2708-6
DOI :
10.1109/WSC.2008.4736309