DocumentCode :
2184355
Title :
Improvement of smart card mechanical properties
Author :
Xiao, Yi ; Zeng, Jianfeng ; Huang, Yucai ; Chae, Jonghyun ; Kim, Senyun ; Chung, Myungkee
Author_Institution :
Samsung Semicond. (China) R&D Co. Ltd., Suzhou, China
fYear :
2011
fDate :
8-11 Aug. 2011
Firstpage :
1
Lastpage :
6
Abstract :
Smart cards are becoming more and more popular in our daily life for its characteristics of portability and intelligence. Since they are always subject to mechanical pressure during delivering or using, its mechanical performance is very important to guarantee good quality. In this paper, three mechanical pressure tests were introduced to characterize the mechanical performance of COB (Chip on board) of smart card. The test data corresponding to four main factors such as chip thickness, mold thickness, EMC (Epoxy molding compound) types and PMC (Post Mod Cure) was analyzed, it is found that EMC type is the key factor to influence smart card mechanical properties. And it is concluded that the best method to improve smart card mechanical performance is to use the EMC type with high mechanical strength and modulus.
Keywords :
mechanical properties; mechanical strength; mechanical testing; moulding; smart cards; COB; EMC; PMC; chip on board; epoxy molding compound; mechanical pressure tests; post mod cure; smart card mechanical property; Electromagnetic compatibility; Electronics packaging; Loading; Mechanical factors; Packaging; Performance evaluation; Smart cards;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Packaging Technology and High Density Packaging (ICEPT-HDP), 2011 12th International Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4577-1770-3
Electronic_ISBN :
978-1-4577-1768-0
Type :
conf
DOI :
10.1109/ICEPT.2011.6066866
Filename :
6066866
Link To Document :
بازگشت