DocumentCode :
2184356
Title :
Simulation analysis of cluster tool operations in wafer fabrication
Author :
Gupta, Amit Kumar ; Lendermann, Peter ; Sivakumar, Appa Iyer ; Priyadi, John
Author_Institution :
Dept. of Mech. Eng., BITS-Pilani, Hyderabad, India
fYear :
2008
fDate :
7-10 Dec. 2008
Firstpage :
2141
Lastpage :
2147
Abstract :
Cluster tools have been one of the proposed alternatives to improve operations performance in semiconductor fabrication. The benefits include high yield throughput, less contamination and less human involvement. Perkinson et al. (1994, 1996) developed analytical models to predict the minimum theoretical time required to complete the cycle in a cluster tool. This paper addresses the verification of these analytical models using simulation. Two simulation models were developed - one with simple configuration and another one that incorporates parallel chambers. The implementation of parallel chambers for the longest process in the cluster tool is tested as the potential area of performance improvement.
Keywords :
semiconductor device manufacture; cluster tool operations; parallel chambers; semiconductor fabrication; simulation analysis; wafer fabrication; Analytical models; Contamination; Fabrication; Humans; Mechanical engineering; Performance analysis; Semiconductor device testing; Steady-state; Throughput; Transient analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Simulation Conference, 2008. WSC 2008. Winter
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-2707-9
Electronic_ISBN :
978-1-4244-2708-6
Type :
conf
DOI :
10.1109/WSC.2008.4736312
Filename :
4736312
Link To Document :
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