Title :
A high precision dc voltage measurement system in JJAVS
Author :
Liu, R.M. ; Deng, P. ; Xue, S.Q.
Author_Institution :
Nat. Inst. of Metrol., Beijing, China
fDate :
June 27 1994-July 1 1994
Abstract :
Some methods are taken in the high precision dc voltage measurement system of JJAVS, including the low thermal emf scanner, especially designed cable, the Hg-Zn cell based voltage reference, the executed program as well as a suitable calibration procedure. Results show that uncertainty of dc voltage measurement system is 5 nV.<>
Keywords :
calibration; measurement standards; mercury (metal); secondary cells; voltage measurement; zinc; 1 V; 10 V; Hg-Zn; Hg-Zn cell; JJAVS; calibration; dc voltage measurement; low thermal emf scanner; measurement standards; uncertainty; voltage reference; Aluminum; Brushes; Cable shielding; Calibration; Circuit testing; Engine cylinders; Measurement standards; Switches; Voltage measurement; Wires;
Conference_Titel :
Precision Electromagnetic Measurements, 1994. Digest., 1994 Conference on
Conference_Location :
Boulder, CO, USA
Print_ISBN :
0-7803-1984-2
DOI :
10.1109/CPEM.1994.333292
