Title :
Semi-anechoic chamber site attenuation calculations [EM waves]
Author_Institution :
Texas Univ., Austin, TX, USA
Abstract :
The reflectivity of an absorber-covered surface depends on the angle of incidence and the polarization as well as the frequency of the incident electromagnetic wave. The problem of calculating all of the angles involved in multiple reflection paths can be simplified by using the method of images. The author shows how the angles can be computed in a straightforward fashion using images. In addition he comments on the limitations of the absorber and image models in representing actual chambers
Keywords :
anechoic chambers; electromagnetic wave absorption; electromagnetic wave reflection; EM wave absorber limitations; EM wave reflection; image models; incidence angle; incident electromagnetic wave; multiple reflection paths; semianechoic chamber site attenuation;
Conference_Titel :
Electromagnetic Compatibility, 1990. Seventh International Conference on
Conference_Location :
York
Print_ISBN :
0-85296-001-8