DocumentCode
2184460
Title
Semi-anechoic chamber site attenuation calculations [EM waves]
Author
Gavenda, J.D.
Author_Institution
Texas Univ., Austin, TX, USA
fYear
1990
fDate
28-31 Aug 1990
Firstpage
109
Lastpage
113
Abstract
The reflectivity of an absorber-covered surface depends on the angle of incidence and the polarization as well as the frequency of the incident electromagnetic wave. The problem of calculating all of the angles involved in multiple reflection paths can be simplified by using the method of images. The author shows how the angles can be computed in a straightforward fashion using images. In addition he comments on the limitations of the absorber and image models in representing actual chambers
Keywords
anechoic chambers; electromagnetic wave absorption; electromagnetic wave reflection; EM wave absorber limitations; EM wave reflection; image models; incidence angle; incident electromagnetic wave; multiple reflection paths; semianechoic chamber site attenuation;
fLanguage
English
Publisher
iet
Conference_Titel
Electromagnetic Compatibility, 1990. Seventh International Conference on
Conference_Location
York
Print_ISBN
0-85296-001-8
Type
conf
Filename
98040
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