• DocumentCode
    2184460
  • Title

    Semi-anechoic chamber site attenuation calculations [EM waves]

  • Author

    Gavenda, J.D.

  • Author_Institution
    Texas Univ., Austin, TX, USA
  • fYear
    1990
  • fDate
    28-31 Aug 1990
  • Firstpage
    109
  • Lastpage
    113
  • Abstract
    The reflectivity of an absorber-covered surface depends on the angle of incidence and the polarization as well as the frequency of the incident electromagnetic wave. The problem of calculating all of the angles involved in multiple reflection paths can be simplified by using the method of images. The author shows how the angles can be computed in a straightforward fashion using images. In addition he comments on the limitations of the absorber and image models in representing actual chambers
  • Keywords
    anechoic chambers; electromagnetic wave absorption; electromagnetic wave reflection; EM wave absorber limitations; EM wave reflection; image models; incidence angle; incident electromagnetic wave; multiple reflection paths; semianechoic chamber site attenuation;
  • fLanguage
    English
  • Publisher
    iet
  • Conference_Titel
    Electromagnetic Compatibility, 1990. Seventh International Conference on
  • Conference_Location
    York
  • Print_ISBN
    0-85296-001-8
  • Type

    conf

  • Filename
    98040