DocumentCode :
2184511
Title :
Analysis of multiple process flows in an ASIC fab with a detailed photolithography area model
Author :
Kabak, Kamil Erkan ; Heavey, Cathal ; Corbett, Vincent
Author_Institution :
Enterprise Res. Centre, Univ. of Limerick, Limerick, Ireland
fYear :
2008
fDate :
7-10 Dec. 2008
Firstpage :
2185
Lastpage :
2193
Abstract :
ASIC fabs are characterized by multiple process flows. This is mainly due to the highly diversified product portfolios within such fabs. In this study, we first examined the cycle time for individual process flows in a medium volume ASIC fab. We compared these process flows in terms of overall cycle time and using a cycle time index. Secondly, focusing on photolithography we developed a simulation model that employs cycle time data to analyze the impacts of process flow diversity. Thirdly, we used this model to examine the impact on cycle time of changing the volumes of wafer starts on different process flows. The detailed results of simulation experiments along with the concluding remarks are given at the end of the study.
Keywords :
application specific integrated circuits; photolithography; ASIC fab; cycle time index; highly diversified product portfolios; multiple process flows; photolithography area model; process flow diversity; Analytical models; Application specific integrated circuits; Costs; Data analysis; Delay effects; Fabrication; Lithography; Predictive models; Resists; Semiconductor device modeling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Simulation Conference, 2008. WSC 2008. Winter
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-2707-9
Electronic_ISBN :
978-1-4244-2708-6
Type :
conf
DOI :
10.1109/WSC.2008.4736318
Filename :
4736318
Link To Document :
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