• DocumentCode
    2184708
  • Title

    The Linear Combination of Bulk Bands-Method for Electron and Hole Subband Calculations in Strained Silicon Films and Surface Layers

  • Author

    Sverdlov, Viktor ; Baumgartner, Oskar ; Kosina, Hans ; Selberherr, Siegfried ; Schanovsky, Franz ; Esseni, David

  • Author_Institution
    Inst. for Microelectron., Tech. Univ. Wien, Vienna
  • fYear
    2009
  • fDate
    27-29 May 2009
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    A generalization of the "Linear Combination of Bulk Bands" method for the calculation of the electron and hole subband structure including strain and spin-orbit interaction is presented. Using the full band structure obtained numerically with the empirical pseudopotential method it is demonstrated that, contrary to the effective mass approximation, the unprimed subbands with the same quantum number in a (001) thin silicon film are not equivalent. It is shown that shear strain modifies the subband effective masses and introduces a large splitting between the unprimed subbands. The generalized method provides accurate subband dispersions for holes demonstrating a large potential for applications.
  • Keywords
    band structure; effective mass; elemental semiconductors; pseudopotential methods; semiconductor thin films; silicon; spin-orbit interactions; Si; effective mass approximation; electron subband calculations; empirical pseudopotential method; hole subband calculations; linear combination of bulk bands-method; quantum number; spin-orbit interaction; strained silicon films; subband dispersions; Capacitive sensors; Charge carrier processes; Effective mass; Electrons; FETs; MOSFETs; Microelectronics; Semiconductor films; Silicon; Stress;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computational Electronics, 2009. IWCE '09. 13th International Workshop on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-3925-6
  • Electronic_ISBN
    978-1-4244-3927-0
  • Type

    conf

  • DOI
    10.1109/IWCE.2009.5091158
  • Filename
    5091158