DocumentCode :
2184756
Title :
Linear inflation rules for the random yield production control problem with uncertain demand: Analysis and computations
Author :
Huh, Woonghee Tim ; Nagarajan, Mahesh
Author_Institution :
Dept. of Ind. Eng.&Oper. Res., Columbia Univ., New York, NY, USA
fYear :
2008
fDate :
7-10 Dec. 2008
Firstpage :
2237
Lastpage :
2243
Abstract :
Since the dawn of wafer fabrication and the production of microelectronic parts a fundamental characteristic of this environment has been uncertainty in production yields and in demand for product. The impact of the uncertainty is so prevalent that even deterministic models in practice have incorporated some allowance for uncertainty through features such as date effective yields, moving average capacity, etc. In this paper, we propose a simple heuristic approach for the inventory control problem with stochastic demand and multiplicative random yield. Our heuristic tries to find the best candidate within a class of policies which are referred to in the literature as the linear inflation rule (LIR) policies. Our approach is computationally fast, easy to implement and intuitive to understand. Moreover, we find that in a significant number of instances our heuristic performs better than several other well-known heuristics that are available in the literature.
Keywords :
integrated circuit manufacture; production control; random processes; stochastic processes; stock control; uncertain systems; heuristic approach; inventory control problem; linear inflation rule; microelectronic parts production; multiplicative random yield production control problem; stochastic demand; uncertain demand; wafer fabrication; Computational modeling; Costs; Fabrication; Industrial engineering; Inventory control; Inventory management; Microelectronics; Operations research; Production control; Uncertainty;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Simulation Conference, 2008. WSC 2008. Winter
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4244-2707-9
Electronic_ISBN :
978-1-4244-2708-6
Type :
conf
DOI :
10.1109/WSC.2008.4736325
Filename :
4736325
Link To Document :
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