• DocumentCode
    2184756
  • Title

    Linear inflation rules for the random yield production control problem with uncertain demand: Analysis and computations

  • Author

    Huh, Woonghee Tim ; Nagarajan, Mahesh

  • Author_Institution
    Dept. of Ind. Eng.&Oper. Res., Columbia Univ., New York, NY, USA
  • fYear
    2008
  • fDate
    7-10 Dec. 2008
  • Firstpage
    2237
  • Lastpage
    2243
  • Abstract
    Since the dawn of wafer fabrication and the production of microelectronic parts a fundamental characteristic of this environment has been uncertainty in production yields and in demand for product. The impact of the uncertainty is so prevalent that even deterministic models in practice have incorporated some allowance for uncertainty through features such as date effective yields, moving average capacity, etc. In this paper, we propose a simple heuristic approach for the inventory control problem with stochastic demand and multiplicative random yield. Our heuristic tries to find the best candidate within a class of policies which are referred to in the literature as the linear inflation rule (LIR) policies. Our approach is computationally fast, easy to implement and intuitive to understand. Moreover, we find that in a significant number of instances our heuristic performs better than several other well-known heuristics that are available in the literature.
  • Keywords
    integrated circuit manufacture; production control; random processes; stochastic processes; stock control; uncertain systems; heuristic approach; inventory control problem; linear inflation rule; microelectronic parts production; multiplicative random yield production control problem; stochastic demand; uncertain demand; wafer fabrication; Computational modeling; Costs; Fabrication; Industrial engineering; Inventory control; Inventory management; Microelectronics; Operations research; Production control; Uncertainty;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Simulation Conference, 2008. WSC 2008. Winter
  • Conference_Location
    Austin, TX
  • Print_ISBN
    978-1-4244-2707-9
  • Electronic_ISBN
    978-1-4244-2708-6
  • Type

    conf

  • DOI
    10.1109/WSC.2008.4736325
  • Filename
    4736325