DocumentCode :
2184851
Title :
A constitutive model for lead-free solders considering the damage effect at high strain rates
Author :
Xuming, Wang ; Fei, Qin ; Tong, An
Author_Institution :
Coll. of Mech. Eng. & Appl. Electron. Technol., Beijing Univ. of Technol., Beijing, China
fYear :
2011
fDate :
8-11 Aug. 2011
Firstpage :
1
Lastpage :
4
Abstract :
The rate-dependent Johnson-Cook material model can predict the stresses and strains of lead-free solder when the strain rate is relatively low (600 s-1). At higher strain rates (1200 s-1 or above), the stress-strain curves predicted by Johnson-Cook model do not agree well with the experimental results when the strain exceeds a threshold value. In this paper, the damage effect is considered into the impact process of lead-free solder specimens.
Keywords :
electronics packaging; solders; stress-strain relations; constitutive model; damage effect; lead-free solders; rate-dependent Johnson-Cook material model; strain rate; stress-strain curves; Lead; Materials; Packaging; Predictive models; Strain; Stress; Johnson-Cook model; constitutive relationship; damage; lead-free solder;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Packaging Technology and High Density Packaging (ICEPT-HDP), 2011 12th International Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4577-1770-3
Electronic_ISBN :
978-1-4577-1768-0
Type :
conf
DOI :
10.1109/ICEPT.2011.6066887
Filename :
6066887
Link To Document :
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