Title :
Active probes for on-wafer millimeter-wave network analysis
Author :
Rodwell, M.J.W. ; Yu, R. ; Reddy, P. ; Allen, S. ; Bhattacharya, U.
Author_Institution :
Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA
fDate :
June 27 1994-July 1 1994
Abstract :
Emerging mm-wave and high-speed fiber-optic applications will demand signal and network instrumentation with bandwidths beyond 1O0 GHz. We have developed nonlinear transmission line (NLTL) pulse generators and NLTL-based sampling circuits with bandwidths exceeding 500 GHz. For on-wafer parameter and waveform measurements, we have constructed active probes incorporating an NLTL-based network analyser IC and rugged, low-loss quartz coplanar-waveguide probe tips. Measurements are made with a pulsed (NLTL) stimulus signal with frequency information obtained by Fourier transformation. On-wafer measurements have been demonstrated to 200 GHz.<>
Keywords :
S-parameters; microwave measurement; microwave reflectometry; probes; pulse generators; waveform analysis; waveguide components; 100 GHz; 200 GHz; 500 GHz; Fourier transformation; NLTL; active probes; mm-wave; network analyser IC; network instrumentation; nonlinear transmission line; on-wafer millimeter-wave network analysis; pulse generators; quartz coplanar-waveguide probe tips; sampling circuits; waveform measurement; Bandwidth; Coplanar transmission lines; Distributed parameter circuits; Instruments; Millimeter wave circuits; Millimeter wave measurements; Probes; Pulse generation; Pulse measurements; Transmission line measurements;
Conference_Titel :
Precision Electromagnetic Measurements, 1994. Digest., 1994 Conference on
Conference_Location :
Boulder, CO, USA
Print_ISBN :
0-7803-1984-2
DOI :
10.1109/CPEM.1994.333314
