DocumentCode :
2185015
Title :
The study of metal meshes on electromagnetic interference shielding effectiveness
Author :
Dichen, Liu ; Suqiao, Deng
Author_Institution :
Wuhan Univ. of Hydraulic & Electr. Eng., China
fYear :
2000
fDate :
2000
Firstpage :
326
Lastpage :
332
Abstract :
There is a good shielding effectiveness of metal meshes on electromagnetic interference caused by all kinds of reasons. 11 metal meshes of different specification of four materials are tested at different frequency steady-state fields and single variable transient fields. Also, their shielding effectiveness is calculated and analyzed. The results of the tests and analysis show that: (1) shielding effectiveness is correlated with factors such as the meshes diameter, mesh variable-density structure standards and so on; (2) within a certain frequency, the effect of mesh size on shielding effectiveness is small; metal materials shielding effectiveness changes with the frequency´s variety; and (3) in shielding of the tying measure of metal mesh weld show its superiority over the screw. We must ground the shielding body reliably. The tests and analysis results of this paper are of important significance in anti-interference study and application to electromagnetic compatibility, modern monitors, communication, and computer control rooms
Keywords :
electromagnetic interference; electromagnetic shielding; anti-interference study; electromagnetic compatibility; electromagnetic interference shielding effectiveness; mesh variable-density structure standards; meshes diameter; metal materials shielding effectiveness; metal meshes; single variable transient fields; steady-state fields; Electromagnetic interference; Electromagnetic measurements; Electromagnetic transients; Frequency measurement; Inorganic materials; Materials testing; Measurement standards; Size measurement; Steady-state; Welding;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Environmental Electromagnetics, 2000. CEEM 2000. Proceedings. Asia-Pacific Conference on
Conference_Location :
Shanghai
Print_ISBN :
7-5635-0420-6
Type :
conf
DOI :
10.1109/CEEM.2000.853958
Filename :
853958
Link To Document :
بازگشت