Title :
Free space material characterization for microwave frequencies
Author :
Kemptner, E. ; Thurner, S.
Author_Institution :
Microwaves & Radar Inst., German Aerosp. Center (DLR), Oberpfaffenhofen, Germany
Abstract :
The knowledge of electrical material parameters for microwave frequencies is of great importance for several applications, e.g. microwave remote sensing and wave propagation. Therefore high precision transmission and reflection measurements on material samples are necessary. In the case of layered media the determination of effective material parameters is aspired. The existing free space measurement facilities of the Institute are presented. Experimental results on flat samples are shown.
Keywords :
inhomogeneous media; microwave materials processing; microwave reflectometry; electrical material parameter; free space material characterization; layered media; microwave frequency; microwave remote sensing; reflection measurement; wave propagation; Antenna measurements; Antennas; Extraterrestrial measurements; Frequency measurement; Materials; Microwave measurements; Reflection; free space; material characterization; microwaves; reflection; transmission; wave propagation;
Conference_Titel :
Antennas and Propagation (EUCAP), 2012 6th European Conference on
Conference_Location :
Prague
Print_ISBN :
978-1-4577-0918-0
Electronic_ISBN :
978-1-4577-0919-7
DOI :
10.1109/EuCAP.2012.6206235
