DocumentCode
2185148
Title
Free space material characterization for microwave frequencies
Author
Kemptner, E. ; Thurner, S.
Author_Institution
Microwaves & Radar Inst., German Aerosp. Center (DLR), Oberpfaffenhofen, Germany
fYear
2012
fDate
26-30 March 2012
Firstpage
3513
Lastpage
3515
Abstract
The knowledge of electrical material parameters for microwave frequencies is of great importance for several applications, e.g. microwave remote sensing and wave propagation. Therefore high precision transmission and reflection measurements on material samples are necessary. In the case of layered media the determination of effective material parameters is aspired. The existing free space measurement facilities of the Institute are presented. Experimental results on flat samples are shown.
Keywords
inhomogeneous media; microwave materials processing; microwave reflectometry; electrical material parameter; free space material characterization; layered media; microwave frequency; microwave remote sensing; reflection measurement; wave propagation; Antenna measurements; Antennas; Extraterrestrial measurements; Frequency measurement; Materials; Microwave measurements; Reflection; free space; material characterization; microwaves; reflection; transmission; wave propagation;
fLanguage
English
Publisher
ieee
Conference_Titel
Antennas and Propagation (EUCAP), 2012 6th European Conference on
Conference_Location
Prague
Print_ISBN
978-1-4577-0918-0
Electronic_ISBN
978-1-4577-0919-7
Type
conf
DOI
10.1109/EuCAP.2012.6206235
Filename
6206235
Link To Document