DocumentCode :
2185489
Title :
The effect of initial warpage of top component on POP assembly
Author :
Qiu, Xiang ; Wang, Jun
Author_Institution :
Dept. of Mater. Sci., Fudan Univ., Shanghai, China
fYear :
2011
fDate :
8-11 Aug. 2011
Firstpage :
1
Lastpage :
5
Abstract :
Higher packaging density is driven by the multifunctional requirements and size shrinkage in handheld applications, which was greatly improved by the 3D packaging technologies. Package-on-package (POP) is one of the 3D packaging solutions, in which components can be fully tested good prior to integration. However, the package warpage due to mismatch of materials properties is a greater challenge for POP than other packaging types during stack process of POP components. Initial components warpage may affect the assembly processes due to the non-coplanarity. The value and direction of warpage could result in the solder joint openings and affect the stresses distribution in the device working state. In the study, effects of initial warpage of top component in POP with two components stacked on the assembly and POP working state were investigated by Finite elements analysis (FEA). The different powers of logic die were considered in the analysis, which were applied on the dies as thermal loading under the device working state. The analysis results in this study provide some clues and guideline for the component initial warpage control in POP, which influence the POP assembly yield and reliability in the device working state.
Keywords :
assembling; finite element analysis; integrated circuit packaging; integrated circuit reliability; solders; three-dimensional integrated circuits; 3D packaging technology; FEA; POP assembly; POP components; component initial warpage control; finite elements analysis; handheld applications; initial component warpage; logic die; material property mismatch; package-on-package assembly; reliability; size shrinkage; solder joint openings; stress distribution; thermal loading; Arrays; Assembly; Electronics packaging; Packaging; Reliability; Stress; Thermal analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Packaging Technology and High Density Packaging (ICEPT-HDP), 2011 12th International Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4577-1770-3
Electronic_ISBN :
978-1-4577-1768-0
Type :
conf
DOI :
10.1109/ICEPT.2011.6066912
Filename :
6066912
Link To Document :
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