Author :
Carlberg, C. ; Bergstrom, I. ; Borgenstrand, H. ; Rouleau, G. ; Schuch, R. ; Soderberg, F. ; Beck, D. ; Bollen, G. ; Emmes, J. ; Jertz, R. ; Kluge, H.-J. ; Schark, E. ; Schwarz, S. ; Schwarz, T. ; Schweikhard, L. ; Senne, P.
Abstract :
A Penning trap mass spectrometer designed for precision measurements of externally injected ions of almost any element and various charge states is described. Variability of the charge state allows high accuracy mass comparisons across the entire stable nuclear chart at the same or similar q/A ratio which is a measuring situation less influenced by systematical errors.<>
Keywords :
ion beams; mass spectrometers; mass spectroscopy; particle beam diagnostics; particle traps; Penning trap mass spectrometer; SMILETRAP; charge states; externally injected ions; high precision mass spectrometer; mass comparisons; nuclear chart; systematical errors; Charge measurement; Current measurement; Cyclotrons; Electron traps; Error correction; Frequency measurement; Ion sources; Magnetic field measurement; Mass spectroscopy; Physics;
