DocumentCode
2185603
Title
Determination of the fine structure constant by measuring the quotient of the Planck constant and the neutron mass
Author
Kruger, E. ; Nistler, W. ; Weirauch, W.
Author_Institution
Physikalisch Tech. Bundesanstalt, Braunschweig, Germany
fYear
1994
fDate
June 27 1994-July 1 1994
Firstpage
388
Abstract
In the silicon crystal the (331) reflection was used. The reflected neutrons had a wavelength of 0.249 nm corresponding to a velocity of 1590 ms/sup -1/. The wavelength follows from the lattice parameter of the silicon crystal. This was measured at the PTB by comparing it with the lattice parameters of the reference silicon crystal. The principle of the velocity measurement is as follows: a roughly monochromatic beam of polarized neutrons is produced by Bragg reflection in a magnetised crystal of Heusler alloy. The beam is modulated by periodically changing the direction of the polarization vector, the frequency being about 750 kHz. For this purpose, a novel type of modulator is used called a meander coil. It produces a magnetic field which is periodic in time and space. After a flight path of several meters the neutrons are incident on the silicon crystal mentioned above. Those with the correct wavelength are back-reflected and returned to the modulator. Here, the beam is again modulated and the two modulations are superposed. The resulting total modulation is analysed by the Bragg reflection in a second magnetised crystal of Heusler alloy.<>
Keywords
atomic fine structure; elemental semiconductors; lattice constants; mass measurement; silicon; velocity measurement; (331) reflection; Bragg reflection; Heusler alloy; Planck constant; Si; Si crystal; fine structure constant; flight path; lattice parameter; magnetised crystal; meander coil; neutron mass; periodically changing direction; polarized neutrons; reference silicon crystal; reflected neutrons; roughly monochromatic beam; second magnetised crystal; silicon crystal; total modulation; velocity measurement; Coils; Frequency; Lattices; Neutrons; Optical modulation; Optical reflection; Polarization; Silicon; Velocity measurement; Wavelength measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Precision Electromagnetic Measurements, 1994. Digest., 1994 Conference on
Conference_Location
Boulder, CO, USA
Print_ISBN
0-7803-1984-2
Type
conf
DOI
10.1109/CPEM.1994.333343
Filename
333343
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