Title :
The LEMMA developer´s toolbox: semi-automated test development for analog and mixed-signal circuits
Author :
Kennedy, Michael Peter ; Grogan, Paul ; Donnell, John O. ; Dwyer, Tom O. ; Wrixon, Adrian
Author_Institution :
Dept. of Electron. & Electr. Eng., Univ. Coll. Dublin, Ireland
fDate :
31 May-3 Jun 1998
Abstract :
Analog test represents an increasing fraction of the cost of producing analog and mixed-signal integrated circuits. While digital testing can focus on identifying spot defects in a systematic manner, analog functional testing requires very precise and accurate measurements. Pessimistic forecasts suggest that “in the next few years the total product cost of a mixed-signal device will be almost entirely due to the cost of the analog tests.” The LEMMA method is a model-based approach to minimizing the analog test effort by identifying a robust minimum set of testpoints
Keywords :
analogue integrated circuits; automatic test software; electronic engineering computing; integrated circuit testing; mixed analogue-digital integrated circuits; software packages; LEMMA developer toolbox; analog circuits; analog functional testing; digital testing; integrated circuits; mixed-signal circuits; model-based approach; semi-automated test development; Circuit testing; Costs; Digital-analog conversion; Educational institutions; Electronic equipment testing; Integrated circuit testing; Linearity; Mixed analog digital integrated circuits; Robustness; System testing;
Conference_Titel :
Circuits and Systems, 1998. ISCAS '98. Proceedings of the 1998 IEEE International Symposium on
Conference_Location :
Monterey, CA
Print_ISBN :
0-7803-4455-3
DOI :
10.1109/ISCAS.1998.706963