Title :
A congestion-driven placement improvement algorithm for large scale sea-of-gates arrays
Author :
Sadakane, Toshiyuki ; Shirota, Hiroshi ; Takahashi, Kazuhiro ; Terai, Masayuki ; Okazaki, Kaoru
Author_Institution :
Mitsubishi Electr. Corp., Itami, Japan
Abstract :
A fast placement improvement algorithm for large scale gate arrays is reported. This algorithm consists of a new cell padding phase and a fast iterative improvement phase. To reduce local routing congestion on a chip, the padding phase virtually expands the size of cells in the congested regions and relocates all the cells to eliminate the cell overlap, preserving the relative cell position. We have developed a formula by which to estimate from the expanded cell sizes the congestion after the relocation in each region on a chip. Using this, the padding phase determines cell sizes that will equalize the congestion throughout a chip, by simulated annealing. The iterative improvement phase minimizes the well known objective function that takes the local congestion into account, but our algorithm is faster because of the use of a new gain estimation method for determining a better position to which to move a cell. The experimental results on large gate array designs indicate that the routability of cell placement is considerably improved by our algorithm
Keywords :
circuit layout CAD; integrated circuit layout; iterative methods; logic CAD; logic arrays; network routing; simulated annealing; cell overlap elimination; cell padding phase; cell placement; congestion-driven placement improvement algorithm; fast iterative improvement phase; fast placement improvement algorithm; gain estimation method; gate arrays; large scale SOG arrays; local routing congestion reduction; objective function; routability; sea-of-gates arrays; simulated annealing; Fabrication; Iterative algorithms; Iterative methods; Large-scale systems; Logic arrays; Logic design; Phase estimation; Programmable logic arrays; Routing; Simulated annealing;
Conference_Titel :
Custom Integrated Circuits Conference, 1997., Proceedings of the IEEE 1997
Conference_Location :
Santa Clara, CA
Print_ISBN :
0-7803-3669-0
DOI :
10.1109/CICC.1997.606692