Title :
A new high-resolution processing method for the deconvolution of optical coherence tomography signals
Author :
Blu, Thierry ; Bay, Herbert ; Unser, Michael
Author_Institution :
Biomed. Imaging Group STI/IOA, Swiss Fed. Inst. of Technol., Lausanne, Switzerland
Abstract :
We show the feasibility and the potential of a new signal processing algorithm for the high-resolution deconvolution of OCT signals. Our technique relies on the description of the measures in a parametric form, each set of four parameters describing the optical characteristics of a physical interface (e.g., complex refractive index, depth). Under the hypothesis of a Gaussian source light, we show that it is possible to recover the 4K parameters corresponding to K interfaces using as few as 4K uniform samples of the OCT signal. With noisy data, we can expect the robustness of our method to increase with the oversampling rate - or with the redundancy of the measures. The validation results show that the quality of the estimation of the parameters (in particular the depth of the interfaces) is narrowly linked to the noise level of the OCT measures - and not to the coherence length of the source light - and to their degree of redundancy.
Keywords :
AWGN; deconvolution; image denoising; image resolution; image sampling; optical tomography; redundancy; 4K parameters; 4K uniform samples; Gaussian source light; K interfaces; OCT signals; complex refractive index; deconvolution; denoising technique; depth; high-resolution processing method; noise level; noisy data; optical characteristics; optical coherence tomography signals; oversampling rate; parameter estimation quality; parametric form; physical interface; redundancy; robustness; signal processing algorithm; source light; validation results; Deconvolution; Nonlinear optics; Optical noise; Optical refraction; Optical signal processing; Optical variables control; Refractive index; Signal processing; Signal processing algorithms; Tomography;
Conference_Titel :
Biomedical Imaging, 2002. Proceedings. 2002 IEEE International Symposium on
Print_ISBN :
0-7803-7584-X
DOI :
10.1109/ISBI.2002.1029373