Title :
Schwarz-Christoffel approach for conductance fluctuations
Author :
van Deursen, A.P.J. ; Vandamme, L.K.J.
Author_Institution :
Eindhoven Univ. of Technol., Eindhoven
Abstract :
Based on an exact two-dimensional current distribution we calculate the geometrical factor for conductance fluctuations. A thin square sample is assumed with four or two active electrodes. Circular electrodes of different size are considered at the sample corners.
Keywords :
current distribution; electric admittance measurement; electrodes; fluctuations; 2D current distribution; Schwarz-Christoffel approach; active electrodes; circular electrodes; conductance fluctuations; geometrical factor; thin square sample; Current density; Current distribution; Current measurement; Electrodes; Fluctuations; H infinity control; Jacobian matrices; Noise shaping; Strips; Voltage;
Conference_Titel :
Electromagnetics in Advanced Applications, 2007. ICEAA 2007. International Conference on
Conference_Location :
Torino
Print_ISBN :
978-1-4244-0767-5
Electronic_ISBN :
978-1-4244-0767-5
DOI :
10.1109/ICEAA.2007.4387432
