• DocumentCode
    2186434
  • Title

    The stress-strain behaviors of solder joints during thermal fatigue process

  • Author

    Zhiting, Geng ; He Qing ; Guohai, Cheng ; Jusheng, Ma

  • Author_Institution
    Sch. of Energy & Power Eng., North China Electr. Power Univ., Beijing, China
  • fYear
    2011
  • fDate
    8-11 Aug. 2011
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    By means of establishing experimental model, the mechanical behavior and changes in basic parameters of new Sn-Zn system lead-free solder joint in thermal fatigue process were studied, and using the result to evaluate the performance of this new type of lead-free solder, providing the accurate boundary conditions for the reliability estimation methods (finite element analysis) of solder. This study of solder joint reliability and life assessment in thermal fatigue process has very important theoretical and practical significance.
  • Keywords
    electronics packaging; finite element analysis; reliability; soldering; solders; stress-strain relations; thermal stress cracking; Sn-Zn; boundary condition; finite element analysis; lead-free solder joint; life assessment; mechanical behavior; reliability estimation method; solder joint reliability; stress-strain behavior; thermal fatigue process; Copper; Fatigue; Lead; Soldering; Strain; Thermal stresses; lead-free solder; stress-strain; thermal fatigue;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology and High Density Packaging (ICEPT-HDP), 2011 12th International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-4577-1770-3
  • Electronic_ISBN
    978-1-4577-1768-0
  • Type

    conf

  • DOI
    10.1109/ICEPT.2011.6066944
  • Filename
    6066944