Title :
Characteristic curve of nonlinear resistive circuits
Author :
Ushida, Akio ; Jiang, Lingge ; Nishio, Yoshifumi
Author_Institution :
Dept. of Electr. & Electron. Eng., Tokushima Univ., Japan
Abstract :
Distinguishing the stability of characteristic curves for nonlinear resistive circuits is requirement and importance to design various electronic circuit exactly. Since every resistive element has a parasitic component, solutions on the characteristic curves are stable or unstable. In this paper, we show that the stability will be mainly changed at the bifurcation points such as limit point and branch point. Applying the curve tracing method, we can decide the unstable regions on characteristic curves by the locations of bifurcation points
Keywords :
bifurcation; circuit stability; nonlinear network analysis; bifurcation point; branch point; characteristic curve; curve tracing; design; electronic circuit; limit point; nonlinear resistive circuit; parasitic component; stability; Bifurcation; Circuit stability; Design engineering; Eigenvalues and eigenfunctions; Electronic circuits; FETs; Jacobian matrices; Nonlinear equations; Stability analysis; Turning;
Conference_Titel :
Circuits and Systems, 1996., IEEE Asia Pacific Conference on
Conference_Location :
Seoul
Print_ISBN :
0-7803-3702-6
DOI :
10.1109/APCAS.1996.569307