DocumentCode :
2186614
Title :
Analysis of temperature field of Embedded Multi-Chip Module
Author :
Chunyue, Huang ; Bin, Wang ; Tianming, Li ; Hegeng, Wei
Author_Institution :
Sch. of Electro-Mech. Eng., Guilin Univ. of Electron. Technol., Guilin, China
fYear :
2011
fDate :
8-11 Aug. 2011
Firstpage :
1
Lastpage :
5
Abstract :
For the Embedded Multi-Chip Module, the placement of the chip directly affects the internal temperature distribution, thereby affecting the reliability. In this paper, taking Embedded Multi-Chip Module as the research object, using ANSYS software to establish embedded type MCM model, performing finite element analysis of Embedded Multi-Chip Module temperature field under the condition of different substrates, different air convection coefficient and the use of heat sink, obtaining temperature distribution of Embedded-type MCM. The results show that different substrates and different air convection coefficient will affect the chip temperature distribution; using heat sink can significantly reduce the chip temperature.
Keywords :
electronic engineering computing; finite element analysis; multichip modules; reliability; temperature distribution; ANSYS software; MCM model; air convection coefficient; embedded multi-chip module; finite element analysis; heat sink; internal temperature distribution; reliability; substrates; temperature field; Finite element methods; Heat sinks; Layout; Substrates; Temperature distribution; Thermal analysis; Thermal conductivity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Packaging Technology and High Density Packaging (ICEPT-HDP), 2011 12th International Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4577-1770-3
Electronic_ISBN :
978-1-4577-1768-0
Type :
conf
DOI :
10.1109/ICEPT.2011.6066952
Filename :
6066952
Link To Document :
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