Title :
Embedded Built-In-Test Detection Circuit for Radio Frequency Systems and Circuits
Author :
Guoyan Zhang ; Farrell, R.
Author_Institution :
Inst. of Microelectron. & Wireless Syst., Ireland Nat. Univ., Maynooth
Abstract :
An embedded rectifier-based built-in-test (BIT) detection circuit for the RF integrated circuits is proposed, and is adopted to transform the RF output signal into DC signal. In this BIT circuit, low threshold voltage MOS transistor with positive substrate bias is used to act as diode to further improve the detecting sensitivity. With this BIT circuit, the minimum input testing sensitivity can be improved to -50dBm. Also, this circuit doesn´t consume current and has very high operating frequency scalability. As an example 2.4GHz low noise amplifier has been verified by using this BIT detection circuit, and gain and linearity are extracted
Keywords :
MOS integrated circuits; built-in self test; integrated circuit testing; low-power electronics; radiofrequency integrated circuits; rectifying circuits; 2.4 GHz; BIT detection circuit; MOS transistor; RF integrated circuits; built-in-test detection circuit; charge pump rectifier; radio frequency circuits; radio frequency systems; Circuit noise; Circuit testing; Diodes; MOSFETs; RF signals; Radio frequency; Radiofrequency integrated circuits; Scalability; Threshold voltage; VHF circuits;
Conference_Titel :
Design and Diagnostics of Electronic Circuits and systems, 2006 IEEE
Conference_Location :
Prague
Print_ISBN :
1-4244-0185-2
DOI :
10.1109/DDECS.2006.1649582
