Title :
A Sinewave Analyzer for Mixed-Signal BIST Applications in a 0.35 um Technology
Author :
Barragan, M.J. ; Vazquez, D. ; Rueda, A.
Author_Institution :
Inst. de Microelectron. de Sevilla-Centro Nacional de Microelectron., Univ. de Sevilla
Abstract :
This paper presents an integrated prototype of a mixed-signal sinewave analyzer. It extracts, in the digital domain, the DC level and the amplitude of the harmonics of a distorted analog sinewave signal. It is based on a double modulation, squarewave and sigma-delta, together with a simple digital processing algorithm. The presented prototype has been integrated in a 0.35 mum technology. It is intended for the characterization of sinewave signals in the range of audio. Experimental measurements in the lab verify the feasibility of the approach and the functionality of the prototype
Keywords :
analogue-digital conversion; built-in self test; spectral analysers; 0.35 micron; analog sinewave signal; analog testing; digital processing algorithm; mixed signal sinewave analyzer; mixed-signal BIST; mixed-signal testing; signal analyzers; Built-in self-test; CMOS technology; Circuit testing; Delta-sigma modulation; Performance evaluation; Prototypes; Robustness; Signal analysis; Signal generators; System testing;
Conference_Titel :
Design and Diagnostics of Electronic Circuits and systems, 2006 IEEE
Conference_Location :
Prague
Print_ISBN :
1-4244-0185-2
DOI :
10.1109/DDECS.2006.1649590
