DocumentCode :
2187003
Title :
Dynamic bending test and simulation of PBGA packages
Author :
Long, Lin ; Li, Guoyuan ; Liao, Xiaoyu ; Xie, Bin ; Shi, Xunqing
Author_Institution :
Sch. of Electron. & Inf. Eng., South China Univ. of Technol., Guangzhou, China
fYear :
2011
fDate :
8-11 Aug. 2011
Firstpage :
1
Lastpage :
5
Abstract :
Solder joints, which serve as mechanical, thermal and electrical interconnections between the electronic packages and the printed circuit board (PCB), are the most vulnerable part in a portable product when the product is subjected to mechanical loading. Therefore, a comprehensive study of mechanics behavior of solder joints is indispensable for understanding the reliability of portable electronic products. JEDEC standards have recommended the procedure and conditions for the board level drop test of portable electronic products. However, it is expensive and time-consuming to run the tests. Also, subsequent analysis is complicated to model the JEDEC drop test. Thus, manufacturers and researchers are trying to develop simpler and cheaper test methods. The use of bend tests instead of drop tests to study the drop impact reliability of PCB assemblies might be one of the solutions. In this paper, reliability of solder joints using 4-point dynamic bending test for the assessment of board level electronic package has been carried out. Finite element model of 4-point dynamic bending test was established and analyzed. The modeling results were validated by the experiment results, which indicates that the numerical simulation methodology developed in this study can be used to extract the details of stress and strain of the critical solder joints under drop/impact loading.
Keywords :
ball grid arrays; bending; circuit reliability; dynamic testing; finite element analysis; plastic packaging; printed circuits; solders; 4-point dynamic bending test; JEDEC drop test; JEDEC standards; PBGA packages; PCB; PCB assembly; board level drop test; board level electronic package assessment; electrical interconnections; electronic packages; finite element model; mechanical interconnections; mechanical loading; numerical simulation methodology; plastic ball grid array packages; portable electronic product reliability; printed circuit board; solder joint reliability; thermal interconnections; Electronics packaging; Finite element methods; Load modeling; Reliability; Soldering; Strain; Stress; FEA; dynamic bending; electronic package; solder joints;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Packaging Technology and High Density Packaging (ICEPT-HDP), 2011 12th International Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4577-1770-3
Electronic_ISBN :
978-1-4577-1768-0
Type :
conf
DOI :
10.1109/ICEPT.2011.6066965
Filename :
6066965
Link To Document :
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