Title :
Discoloration mechanism of silver-filled adhesive used for packaging solder joint
Author :
Rao, Zhenzhen ; Bao, Shengxiang ; Lai, Weiming ; Shi, Guanghua ; Li, Peng ; Ye, Jianhai
Author_Institution :
State Key Lab. of Electron. Thin Films & Integrated Devices, Univ. of Electron. Sci. & Technol. of China, Chengdu, China
Abstract :
Owing to the trend of the miniaturization and high density, conductive adhesive is regarded as the new promising kind of electronic packaging and bonding materials. Reliability of adhesives has been one of the key issues in practical applications. A phenomenon occurred on packaging solder joint of silver-filled adhesive, which declined the normal performance and reliability of phase shifter, was presented in this paper. Base on unusual discoloration (turning black) of adhesives on solders, scanning electron microscope (SEM) and electron probe energy disperse spectroscopy (EDS) were carried out on the microstructure and micro-area composition analysis. The discoloration mechanism was found through comparing the composition of the normal solder with the discolored. Discoloration mechanism and potential effect on reliability were evaluated. The study in this case is of great significance in applications.
Keywords :
adhesive bonding; conductive adhesives; electron probes; electronics packaging; reliability; scanning electron microscopes; silver; solders; Ag; SEM; bonding material; conductive adhesive reliability; discoloration mechanism; electron probe EDS; electron probe energy disperse spectroscopy; electronic packaging; microarea composition analysis; microstructure analysis; packaging solder joint; phase shifter reliability; scanning electron microscope; silver-filled adhesive; Conductive adhesives; Conductivity; Packaging; Reliability; Scanning electron microscopy; Silicon; Silver;
Conference_Titel :
Electronic Packaging Technology and High Density Packaging (ICEPT-HDP), 2011 12th International Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4577-1770-3
Electronic_ISBN :
978-1-4577-1768-0
DOI :
10.1109/ICEPT.2011.6066968