Title :
A Unique March Test Algorithm for the Wide Spread of Realistic Memory Faults in SRAMs
Author :
Benso, A. ; Bosio, A. ; Di Carlo, S. ; Di Natale, G. ; Prinetto, P.
Author_Institution :
Dipt. di Automatica e Informatica, Politecnico di Torino
Abstract :
Among the different types of algorithms proposed to test static random access memories (SRAMs), march tests have proven to be faster, simpler and regularly structured. A large number of march tests with different fault coverage have been published. Usually different march tests detect only a specific set of memory faults. The always growing memory production technology introduces new classes of fault, making a key hurdle the generation of new march tests. The aim of this paper is to target the whole set of realistic fault model and to provide a unique march test able to reduce the test complexity of 15.4% than state-of-the-art march algorithm
Keywords :
SRAM chips; fault simulation; integrated circuit testing; SRAM; march test algorithm; memory production technology; realistic memory faults; static random access memories; Automatic testing; Circuit faults; Digital systems; Fault detection; Production; Random access memory; SRAM chips; Semiconductor memory; System-on-a-chip; Taxonomy;
Conference_Titel :
Design and Diagnostics of Electronic Circuits and systems, 2006 IEEE
Conference_Location :
Prague
Print_ISBN :
1-4244-0185-2
DOI :
10.1109/DDECS.2006.1649602
