• DocumentCode
    2187213
  • Title

    Study on the adhesion and reliability of Epoxy Molding Compound and shaped Pd Preplated leadframes

  • Author

    Ni, Mingzhi ; Zhang, Wenjing ; Li, Ming ; Mao, Dali

  • Author_Institution
    Shanghai Jiao Tong Univ., Shanghai, China
  • fYear
    2011
  • fDate
    8-11 Aug. 2011
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    The weak adhesion between the Epoxy Molding Compound (EMC) and Pd Preplated leadframes (Pd PPF´s) often causes delaminations and reduces the reliability of integrated circuit. This paper reports on a practical method of dramatically improving the adhesion of EMC and Pd PPF´s using electroplating shaped nickel layers. Button shear tests indicate that the adhesions between the EMC and three different shaped nickel PPFs is 169% higher than that of conventional PPFs. The reliability of the adhesion improvement effects was detected by Moisture Sensitivity Level 1(MSL-l) test and high temperature button shear test, which proved the high reliability of the shaped PPF´s. The mechanical interlocking effects caused by increased surface roughness are the major reason for the improved adhesion as well as the transition of failure modes from adhesive failure to cohesive failure.
  • Keywords
    adhesive bonding; electroplated coatings; integrated circuit bonding; integrated circuit metallisation; integrated circuit packaging; integrated circuit reliability; integrated circuit testing; moulding; nickel; palladium; Moisture Sensitivity Level 1 test; Ni; Pd; adhesive failure; cohesive failure; delaminations; electroplating shaped nickel layer; epoxy molding compound adhesion; epoxy molding compound reliability; high temperature button shear test; integrated circuit reliability; shaped preplated leadframes; shear tests; Adhesives; Electromagnetic compatibility; Lead; Nickel; Rough surfaces; Surface morphology; Surface roughness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology and High Density Packaging (ICEPT-HDP), 2011 12th International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-4577-1770-3
  • Electronic_ISBN
    978-1-4577-1768-0
  • Type

    conf

  • DOI
    10.1109/ICEPT.2011.6066971
  • Filename
    6066971