Title :
Low-Cost Concurrent Error Detection for FSMs Implemented Using Embedded Memory Blocks of FPGAs
Author :
Krasniewski, Adam
Author_Institution :
Inst. of Telecommun., Warsaw Univ. of Technol.
Abstract :
We present a number of low-cost concurrent error detection (CED) schemes for finite state machines (FSMs) implemented using embedded memory blocks available in FPGAs. The experimental results show that for many of the examined benchmark circuits, some of the proposed schemes provide for a reasonable level of error detection at a very low circuitry overhead, not exceeding 10%. The proposed set of CED schemes offers the designer an opportunity to trade-off error detection efficiency with implementation cost
Keywords :
embedded systems; error detection; field programmable gate arrays; finite state machines; CED schemes; FPGA; concurrent error detection schemes; embedded memory blocks; finite state machines; Automata; Circuit faults; Circuit testing; Costs; Electrical fault detection; Fault detection; Field programmable gate arrays; Random access memory; Registers; Sequential circuits;
Conference_Titel :
Design and Diagnostics of Electronic Circuits and systems, 2006 IEEE
Conference_Location :
Prague
Print_ISBN :
1-4244-0185-2
DOI :
10.1109/DDECS.2006.1649608
