• DocumentCode
    2187344
  • Title

    Fault-tolerant 2-D Mesh Network-On-Chip for MultiProcessor Systems-on-Chip

  • Author

    Kariniemi, H. ; Nurmi, J.

  • Author_Institution
    Inst. of Digital & Comput. Syst., Tampere Univ. of Technol.
  • fYear
    2006
  • fDate
    18-21 April 2006
  • Firstpage
    184
  • Lastpage
    189
  • Abstract
    Large system-on-chip (SoC) circuits contain increasing number of embedded processor cores while their communication infrastructures are implemented with networks-on-chip (NOC). Due to the increasing transistor and wire densities these circuits are more difficult to test, which requires that different self-diagnosis and self-test methods must be mobilized. Self-diagnosis and self-repair methods usable for invalidating at least minor manufacturing defects of the NOCs may also be needed for improving the chip yield. This paper presents a new fault-tolerant NOC with two-dimensional mesh topology for future multi-processor SoCs (MPSoC). The improved fault-tolerance is implemented with fault-diagnosis-and-repair (FDAR) system, which makes the NOC more testable and diagnosable. The FDAR can detect static, dynamic, and transient faults and repairs the faulty switches. Furthermore, it makes it possible also for the local processors to reconfigure their switch nodes to work correctly. After the reconfigurations a novel adaptive routing algorithm named fault-tolerant dimension-order-routing (FTDOR) is able to route packets adaptively in seriously faulty networks. The usage of the FTDOR makes it also possible to use all of the ports of the edge switch nodes for connecting processors to the NOC, which improves the utilization of the NOC´s resources
  • Keywords
    fault diagnosis; logic testing; microprocessor chips; multiprocessing systems; network-on-chip; 2D mesh network-on-chip; 2D mesh topology; adaptive routing algorithm; edge switch nodes; fault tolerance; fault-diagnosis-and-repair system; fault-tolerant dimension-order-routing; fault-tolerant network-on-chip; multiprocessor systems-on-chip; Automatic testing; Circuit faults; Circuit testing; Fault tolerance; Fault tolerant systems; Multiprocessing systems; Network-on-a-chip; Switches; System-on-a-chip; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design and Diagnostics of Electronic Circuits and systems, 2006 IEEE
  • Conference_Location
    Prague
  • Print_ISBN
    1-4244-0185-2
  • Type

    conf

  • DOI
    10.1109/DDECS.2006.1649609
  • Filename
    1649609