DocumentCode
2187344
Title
Fault-tolerant 2-D Mesh Network-On-Chip for MultiProcessor Systems-on-Chip
Author
Kariniemi, H. ; Nurmi, J.
Author_Institution
Inst. of Digital & Comput. Syst., Tampere Univ. of Technol.
fYear
2006
fDate
18-21 April 2006
Firstpage
184
Lastpage
189
Abstract
Large system-on-chip (SoC) circuits contain increasing number of embedded processor cores while their communication infrastructures are implemented with networks-on-chip (NOC). Due to the increasing transistor and wire densities these circuits are more difficult to test, which requires that different self-diagnosis and self-test methods must be mobilized. Self-diagnosis and self-repair methods usable for invalidating at least minor manufacturing defects of the NOCs may also be needed for improving the chip yield. This paper presents a new fault-tolerant NOC with two-dimensional mesh topology for future multi-processor SoCs (MPSoC). The improved fault-tolerance is implemented with fault-diagnosis-and-repair (FDAR) system, which makes the NOC more testable and diagnosable. The FDAR can detect static, dynamic, and transient faults and repairs the faulty switches. Furthermore, it makes it possible also for the local processors to reconfigure their switch nodes to work correctly. After the reconfigurations a novel adaptive routing algorithm named fault-tolerant dimension-order-routing (FTDOR) is able to route packets adaptively in seriously faulty networks. The usage of the FTDOR makes it also possible to use all of the ports of the edge switch nodes for connecting processors to the NOC, which improves the utilization of the NOC´s resources
Keywords
fault diagnosis; logic testing; microprocessor chips; multiprocessing systems; network-on-chip; 2D mesh network-on-chip; 2D mesh topology; adaptive routing algorithm; edge switch nodes; fault tolerance; fault-diagnosis-and-repair system; fault-tolerant dimension-order-routing; fault-tolerant network-on-chip; multiprocessor systems-on-chip; Automatic testing; Circuit faults; Circuit testing; Fault tolerance; Fault tolerant systems; Multiprocessing systems; Network-on-a-chip; Switches; System-on-a-chip; Wire;
fLanguage
English
Publisher
ieee
Conference_Titel
Design and Diagnostics of Electronic Circuits and systems, 2006 IEEE
Conference_Location
Prague
Print_ISBN
1-4244-0185-2
Type
conf
DOI
10.1109/DDECS.2006.1649609
Filename
1649609
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