Title :
Embedded Self Repair by Transistor and Gate Level Reconfiguration
Author :
Kothe, Rene ; Vierhaus, Heinrich T. ; Coym, Torsten ; Vermeiren, Wolfgang ; Straube, Bernd
Author_Institution :
Brandenburg Univ. of Technol. Cottbus
Abstract :
Technology forecasts predict that nanometer IC technologies do not yield large chip areas without non-functional transistors. Mechanism of redundancy and re-organization for self-repair at the transistor and gate level are required, which can effectively handle realistic fault effects in CMOS logic circuits
Keywords :
CMOS logic circuits; embedded systems; fault diagnosis; integrated circuit testing; logic testing; CMOS logic circuits; embedded self repair; gate level reconfiguration; nanometer IC technologies; realistic fault effects; transistor level reconfiguration; CMOS logic circuits; CMOS technology; Circuit faults; Design automation; Field programmable gate arrays; Logic circuits; Logic testing; Redundancy; Sections; Technology forecasting;
Conference_Titel :
Design and Diagnostics of Electronic Circuits and systems, 2006 IEEE
Conference_Location :
Prague
Print_ISBN :
1-4244-0185-2
DOI :
10.1109/DDECS.2006.1649613
