Title :
Test Considerations about the Structured ASIC Paradigm
Author :
Bernardi, P. ; Grosso, M.
Author_Institution :
Dip. Automatica e Informatica, Politecnico di Torino
Abstract :
We present a survey on the academic and industrial structured ASIC practices, especially focusing on the test strategies currently in use. Then, we compare two possible test generation flows, underlining the most critical aspects introduced by the adoption of the structured ASIC methodology
Keywords :
application specific integrated circuits; automatic test pattern generation; integrated circuit testing; automatic test pattern generation; integrated circuit testing; structured ASIC paradigm; test strategies; Application specific integrated circuits; Circuit synthesis; Circuit testing; Costs; Design for testability; Field programmable gate arrays; Flip-flops; Manufacturing industries; Metallization; Tiles;
Conference_Titel :
Design and Diagnostics of Electronic Circuits and systems, 2006 IEEE
Conference_Location :
Prague
Print_ISBN :
1-4244-0185-2
DOI :
10.1109/DDECS.2006.1649622
