New Current Monitor Using Auto Zero Voltage Comparator for IDD Testing of Mixed-signal Circuits

Author

Nagy, N. ; Stopjakova, V.

Author_Institution

Dept. of Microelectron., Slovak Univ. of Technol., Bratislava

fYear

2006

fDate

18-21 April 2006

Firstpage

234

Lastpage

235

Abstract

An. approach to the dynamic supply current sensing based on the measurement of voltage drop across a parasitic resistance of the supply voltage metal routing is presented. Auto-zero technique for voltage comparator offset cancellation, which provides very accurate and sensitive low voltage drop measurement is proposed. Therefore, one may use the proposed sensor as a current monitor for dynamic current testing of mixed-signal circuits without any additional element necessarily connected in series with the power supply line. The proposed current monitor was designed in a 0.35 mum CMOS technology

Keywords

CMOS integrated circuits; comparators (circuits); integrated circuit testing; mixed analogue-digital integrated circuits; 0.35 micron; CMOS technology; auto zero voltage comparator; auto-zero technique; current monitor; dynamic supply current sensing; metal routing; mixed-signal circuits; power supply line; voltage drop measurement; CMOS technology; Circuit testing; Current measurement; Current supplies; Electrical resistance measurement; Low voltage; Monitoring; Power supplies; Routing; Voltage measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Design and Diagnostics of Electronic Circuits and systems, 2006 IEEE

Conference_Location

Prague

Print_ISBN

1-4244-0185-2

Type

conf

DOI

10.1109/DDECS.2006.1649624

Filename

1649624