Title :
New Current Monitor Using Auto Zero Voltage Comparator for IDD Testing of Mixed-signal Circuits
Author :
Nagy, N. ; Stopjakova, V.
Author_Institution :
Dept. of Microelectron., Slovak Univ. of Technol., Bratislava
Abstract :
An. approach to the dynamic supply current sensing based on the measurement of voltage drop across a parasitic resistance of the supply voltage metal routing is presented. Auto-zero technique for voltage comparator offset cancellation, which provides very accurate and sensitive low voltage drop measurement is proposed. Therefore, one may use the proposed sensor as a current monitor for dynamic current testing of mixed-signal circuits without any additional element necessarily connected in series with the power supply line. The proposed current monitor was designed in a 0.35 mum CMOS technology
Keywords :
CMOS integrated circuits; comparators (circuits); integrated circuit testing; mixed analogue-digital integrated circuits; 0.35 micron; CMOS technology; auto zero voltage comparator; auto-zero technique; current monitor; dynamic supply current sensing; metal routing; mixed-signal circuits; power supply line; voltage drop measurement; CMOS technology; Circuit testing; Current measurement; Current supplies; Electrical resistance measurement; Low voltage; Monitoring; Power supplies; Routing; Voltage measurement;
Conference_Titel :
Design and Diagnostics of Electronic Circuits and systems, 2006 IEEE
Conference_Location :
Prague
Print_ISBN :
1-4244-0185-2
DOI :
10.1109/DDECS.2006.1649624
