March Pre: an Efficient Test for Resistive-Open Defects in the SRAM Pre-charge Circuit

Author

Dilillo, L. ; Girard, P. ; Pravossoudovitch, S. ; Virazel, A. ; Bastian, M.

Author_Institution

de Robotique et de Microelectronique de Montpellier, Univ. de Montpellier

fYear

2006

fDate

18-21 April 2006

Firstpage

254

Lastpage

259

Abstract

In this paper, we first present an exhaustive study on the influence of resistive-open defects in the pre-charge circuit of SRAMs. We show that these defects may disturb the pre-charge circuit, thus disturbing the read operation. This faulty behavior can be modeled by two types of dynamic faults called un-restored write faults (URWFs) and un-restored read faults (URRFs). For this type of faults, we next propose a new test algorithm called March Pre. The main advantage of March Pre is its complexity, which is twice lower (2.5N) than that of the reference MATS+ algorithm (5N). On the other side, an obvious shortcoming is that it targets only faults in pre-charge circuits. However, with its properties, March Pre makes the test but also the diagnosis easier in SRAM memories sensitive to pre-charge defects

Keywords

SRAM chips; fault simulation; integrated circuit testing; MATS+ algorithm; March Pre; SRAM memories; dynamic faults; integrated circuit testing; pre-charge circuit; pre-charge defects; read operation; resistive-open defects; unrestored read faults; unrestored write faults; Circuit faults; Circuit simulation; Circuit testing; Fault detection; Government; Performance evaluation; Random access memory; Robots; System-on-a-chip; Uniform resource locators;

fLanguage

English

Publisher

ieee

Conference_Titel

Design and Diagnostics of Electronic Circuits and systems, 2006 IEEE

Conference_Location

Prague

Print_ISBN

1-4244-0185-2

Type

conf

DOI

10.1109/DDECS.2006.1649631

Filename

1649631