Title :
Influence of the device-width on the accuracy of quantization in the integer quantum Hall effect
Author :
Jeanneret, B. ; Jeckelmann, B. ; Buhlmann, H.-J. ; Houdre, R. ; Ilegems, M.
Author_Institution :
Swiss Federal Office of Metrol., Wabern, Switzerland
fDate :
June 27 1994-July 1 1994
Abstract :
Using a cryogenic current comparator bridge (CCC), several Hall samples of different width were compared to check whether size effect may affect the accuracy of quantization in the integer quantum Hall effect (QHE). In the range from 1 mm down to 10 /spl mu/m we did not observe any width dependence of the Hall resistance. The difference between the quantized Hall resistances of the i=2 plateaus of the various samples was found to be smaller than the measurement uncertainty (typically at the ppb-level).<>
Keywords :
bridge circuits; comparators (circuits); electric resistance measurement; measurement standards; quantum Hall effect; 1 mm to 10 mum; GaAs-AlGaAs; GaAs/AlGaAs; QHE; cryogenic current comparator bridge; integer quantum Hall effect; measurement uncertainty; quantization; quantized Hall resistance; resistance standard; size effect; width dependence; Bridges; Cryogenics; Electrical resistance measurement; Gallium arsenide; Hall effect; Measurement uncertainty; Metrology; Quantization; Silicon; Voltage;
Conference_Titel :
Precision Electromagnetic Measurements, 1994. Digest., 1994 Conference on
Conference_Location :
Boulder, CO, USA
Print_ISBN :
0-7803-1984-2
DOI :
10.1109/CPEM.1994.333427
