Title :
A high quality 1-V Josephson series array developed at KRISS
Author :
Se II Park ; Kyu-Tae Kim ; Rae Duk Lee
Author_Institution :
Korea Adv. Inst. of Sci. & Technol., Seoul, South Korea
fDate :
June 27 1994-July 1 1994
Abstract :
By combining the selective niobium anodization process (SNAP) and the image reversal technique (IRT) a new fabrication process of integrated Josephson series array has been developed at KRISS. The array containing 2520 Nb/Al/sub 2/O/sub 3//Nb tunnel junctions produced stable quantized voltage steps up to 2 V with stability times of more than 5-h.<>
Keywords :
aluminium compounds; anodisation; measurement standards; niobium; superconducting junction devices; voltage measurement; 1 V; 2 V; 5 h; Josephson series array; KRISS; Nb-Al/sub 2/O/sub 3/-Nb; Nb/Al/sub 2/O/sub 3//Nb tunnel junctions; SNAP; fabrication; image reversal; integrated Josephson series array; quantized voltage steps; selective niobium anodization; stability times; Attenuation; Calibration; Critical current; Fabrication; Niobium; Stability; Standards development; Stripline; Superconducting integrated circuits; Voltage;
Conference_Titel :
Precision Electromagnetic Measurements, 1994. Digest., 1994 Conference on
Conference_Location :
Boulder, CO, USA
Print_ISBN :
0-7803-1984-2
DOI :
10.1109/CPEM.1994.333431
