Title :
The performance and reliability of NIST 10-V Josephson arrays
Author :
Hamilton, C.A. ; Burroughs, C.J.
Author_Institution :
Nat. Inst. of Stand. & Technol., Boulder, CO, USA
fDate :
June 27 1994-July 1 1994
Abstract :
This paper reviews eight years of fabrication of 10-V Josephson array chips at NIST and the performance and reliability of these chips at 22 different standards laboratories. Failure mechanisms and statistical data on failure rates are presented for devices made with both Nb/Nb/sub 2/O/sub 5//Pb and Nb/Al/sub 2/O/sub 3//Nb junctions.<>
Keywords :
aluminium compounds; failure analysis; lead; measurement standards; niobium; niobium compounds; statistical analysis; superconducting junction devices; voltage measurement; 0-V Josephson arrays; 10 V; NIST; Nb-Al/sub 2/O/sub 3/-Nb; Nb-Nb/sub 2/O/sub 5/-Pb; Nb/Al/sub 2/O/sub 3//Nb junctions; Nb/Nb/sub 2/O/sub 5//Pb junctions; fabrication; failure mechanisms; performance; reliability; standards laboratories; statistical data; voltage standard; Critical current; Degradation; Fabrication; Failure analysis; Humidity; Laboratories; Moisture; NIST; Niobium; Stability;
Conference_Titel :
Precision Electromagnetic Measurements, 1994. Digest., 1994 Conference on
Conference_Location :
Boulder, CO, USA
Print_ISBN :
0-7803-1984-2
DOI :
10.1109/CPEM.1994.333434
