DocumentCode :
2188112
Title :
Real time DSP based identification of surface defects using content-based imaging technique
Author :
Kumar, Ashok ; Gupta, Sumana
Author_Institution :
Instrum. Res. & Dev. Establ., Defence Res. & Dev. Organ., Uttar Pradesh, India
Volume :
2
fYear :
2000
fDate :
19-22 Jan. 2000
Firstpage :
113
Abstract :
In this paper we propose a technique for the design and development of an automatic visual inspection system for identification of surface defects produced in the steel industry. The proposed DSP based system is implemented using an interconnection of four subsystems: (i) sensing, (ii) data acquisition, (iii) feature (content) extraction and (iv) feature comparison. The system is based on identification of defects using content-based matching of query image with those of database images. The query image is the on-line grabbed image by CCD cameras. The database (off-line) is prepared for all the expected query image by extracting relevant features. An image histogram is used for feature extraction. The computational complexity and storage requirements are reduced by decomposing histogram using wavelet transform. The root mean square (RMS) metric is used for distance calculation.
Keywords :
automatic optical inspection; digital signal processing chips; feature extraction; real-time systems; steel industry; wavelet transforms; CCD cameras; automatic visual inspection system; computational complexity; content extraction; content-based imaging technique; content-based matching; data acquisition; database images; feature comparison; feature extraction; histogram decomposition; image histogram; off-line database; quality control; query image; real time DSP based identification; root mean square metric; sensing; steel industry; steel sheet; storage requirements; subsystems interconnection; surface defects identification; wavelet transform; Charge coupled devices; Data acquisition; Data mining; Digital signal processing; Feature extraction; Histograms; Image databases; Inspection; Metals industry; Spatial databases;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Technology 2000. Proceedings of IEEE International Conference on
Print_ISBN :
0-7803-5812-0
Type :
conf
DOI :
10.1109/ICIT.2000.854109
Filename :
854109
Link To Document :
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