DocumentCode
2188215
Title
Towards an ultra-high density interconnect (UHDI) technology
Author
Krishnamurthy, V. ; Rose, J. ; Saia, R. ; Durocher, K.
Author_Institution
Gen. Electr. Corp. Res. & Dev. Center, Schenectady, NY, USA
Volume
1
fYear
1997
fDate
26-30 Oct 1997
Firstpage
2.3
Abstract
We present a plastic based 3-D MCM technology with a path for achieving ultra-high densities with abroad array of applications. This path has been chosen as a means for realizing novel next generation digital architectures. The 3D MCM is composed of layers of a plastic based MCM interconnected together with a z-axis conductive adhesive film. Each 2D MCM is fabricated with feed throughs which provide a connection from the top to the back side of the MCM. In this paper, we will demonstrate this new technology with a four layer 3D mechanical stack with a stack thickness of 1.2 mm and a Si density of 58 mm3 /IC. We will also presented a path towards forming an ultra-thin 3D stack by reducing the thickness of the plastic substrate and the interconnect layer
Keywords
adhesion; elemental semiconductors; integrated circuit packaging; multichip modules; polymer films; silicon; 1.2 mm; 2D MCM; 3D MCM; Si; Si density; abroad array; feed throughs; four layer 3D mechanical stack; interconnect layer; next generation digital architectures; plastic based MCM; plastic substrate; stack thickness; ultra-high densities; ultra-high density interconnect technology; ultrathin 3-D stack; z-axis conductive adhesive film; Conductive adhesives; Conductive films; Electronics packaging; Feeds; Integrated circuit interconnections; Microelectronics; Plastic films; Space technology; Stacking; Substrates;
fLanguage
English
Publisher
ieee
Conference_Titel
Digital Avionics Systems Conference, 1997. 16th DASC., AIAA/IEEE
Conference_Location
Irvine, CA
Print_ISBN
0-7803-4150-3
Type
conf
DOI
10.1109/DASC.1997.635037
Filename
635037
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