• DocumentCode
    2188276
  • Title

    The effect of thermal aging on the mechanical properties of molding compounds and the reliability of electronic packages

  • Author

    Yang, Daoguo ; Cui, Zaifu

  • Author_Institution
    Guangxi Key Lab. of Manuf. Syst. & Adv. Manuf. Technol. Sch. of Mech. & Electr. Eng., Guilin Univ. of Electron. Technol., Guilin, China
  • fYear
    2011
  • fDate
    8-11 Aug. 2011
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Epoxy Molding Compounds are widely used in electronic packaging as encapsulants of electronic devices. Previous research has indicated that thermal aging has great influence on the material properties of molding compounds. The thermal aging effects will certainly influence the reliability performance of the packages. It is very necessary to study the effect of thermal aging on the mechanical properties of molding compounds and the reliability of electronic packages. In this paper the effect of thermal aging on the mechanical properties of molding compounds and the reliability of electronic packages is presented. Experimental study of the aging effect on the mechanical properties of the molding compounds was performed. The samples were aged at various levels of temperature and aging times. DMA and TMA were used to measure the moduli, coefficients of thermal expansion (CTE), and the glass transition temperature (Tg). It is found that thermal aging has significant influence on the rubbery modulus and the glass transition temperature (Tg). Oxidation is believed to be one of the main mechanisms for the degradation of the material properties. A numerical model was used to estimate the modulus of the oxidized layer. 3D finite element models were established to simulate the impact of the aging effect on the stress/strain of the package. The modeling results indicate that the aging of the compounds have a significant impact on the stress/strain status in the package.
  • Keywords
    ageing; composite materials; electronics packaging; finite element analysis; glass transition; moulding; oxidation; resins; silicon compounds; stress-strain relations; thermal expansion; 3D finite element models; SiO2; aging effect; electronic packages; epoxy molding compounds; glass transition temperature; mechanical property; oxidation; oxidized layer; reliability; rubbery modulus; stress-strain curve; thermal aging; thermal expansion; Aging; Compounds; Electromagnetic compatibility; Electronic packaging thermal management; Mechanical factors; Reliability; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology and High Density Packaging (ICEPT-HDP), 2011 12th International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-4577-1770-3
  • Electronic_ISBN
    978-1-4577-1768-0
  • Type

    conf

  • DOI
    10.1109/ICEPT.2011.6067004
  • Filename
    6067004