Title :
Physical insight into fractional power dependence of saturation current on gate voltage in advanced short channel MOSFETs (alpha-power law model)
Author :
Im, Hyunsik ; Song, M. ; Hiramoto, T. ; Sakurai, T.
Author_Institution :
Inst. of Ind. Sci., Univ. of Tokyo, Japan
Abstract :
The physical origin of the fractional power dependence of MOSFET drain current on gate voltage, namely the α-power law model that has been considered as a fully empirical model, is analytically investigated. For this purpose, we have developed a new physics-based analytical drain current model. Using this model, we prove that the saturation current can be simplified in the form of B·(Vg-VTH)α, α-power law model. The physical interpretations of α, B, VTH are elucidated, and their analytical expressions are given in terms of MOSFET parameters. Since the α-power model is compact and physics-based, it allows circuit designers to easily estimate the power dissipation and the gate delay time in a predictable manner.
Keywords :
MOSFET; delay estimation; electric current; semiconductor device models; α-power law model; MOSFET drain current; MOSFET parameters; alpha-power law model; fractional power dependence; gate delay time; gate voltage; physics-based analytical drain current model; power dissipation; saturation current; short channel MOSFET; Analytical models; Circuits; Collaboration; Delay effects; Delay estimation; MOSFETs; Permission; Power dissipation; Predictive models; Voltage;
Conference_Titel :
Low Power Electronics and Design, 2002. ISLPED '02. Proceedings of the 2002 International Symposium on
Print_ISBN :
1-5811-3475-4
DOI :
10.1109/LPE.2002.146701