DocumentCode
2188346
Title
Physical insight into fractional power dependence of saturation current on gate voltage in advanced short channel MOSFETs (alpha-power law model)
Author
Im, Hyunsik ; Song, M. ; Hiramoto, T. ; Sakurai, T.
Author_Institution
Inst. of Ind. Sci., Univ. of Tokyo, Japan
fYear
2002
fDate
2002
Firstpage
13
Lastpage
18
Abstract
The physical origin of the fractional power dependence of MOSFET drain current on gate voltage, namely the α-power law model that has been considered as a fully empirical model, is analytically investigated. For this purpose, we have developed a new physics-based analytical drain current model. Using this model, we prove that the saturation current can be simplified in the form of B·(Vg-VTH)α, α-power law model. The physical interpretations of α, B, VTH are elucidated, and their analytical expressions are given in terms of MOSFET parameters. Since the α-power model is compact and physics-based, it allows circuit designers to easily estimate the power dissipation and the gate delay time in a predictable manner.
Keywords
MOSFET; delay estimation; electric current; semiconductor device models; α-power law model; MOSFET drain current; MOSFET parameters; alpha-power law model; fractional power dependence; gate delay time; gate voltage; physics-based analytical drain current model; power dissipation; saturation current; short channel MOSFET; Analytical models; Circuits; Collaboration; Delay effects; Delay estimation; MOSFETs; Permission; Power dissipation; Predictive models; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Low Power Electronics and Design, 2002. ISLPED '02. Proceedings of the 2002 International Symposium on
Print_ISBN
1-5811-3475-4
Type
conf
DOI
10.1109/LPE.2002.146701
Filename
1029504
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