DocumentCode :
2188370
Title :
Non-interfering thermo-electric measurements on power hybrid microwave devices
Author :
Rauly, D. ; Alkhoja, J.
Author_Institution :
LMTMS-IUT, Montlucon, France
fYear :
1994
fDate :
June 27 1994-July 1 1994
Firstpage :
287
Abstract :
The feasibility of low cost, non-interfering thermoelectric measurements on microwave devices is examined. The classical difficulty induced by the presence of metallic thermocouples is avoid by the use of bi-metal access lines, in a manner that DC Seebeck voltages can be de-embedded from the global signal available on the external ports.<>
Keywords :
Seebeck effect; hybrid integrated circuits; microstrip lines; microwave integrated circuits; microwave measurement; power integrated circuits; solid-state microwave devices; thermocouples; thick film resistors; DC Seebeck voltages; bimetal access lines; boundary element method; equivalent circuits; feasibility; modelling; noninterfering thermoelectric measurements; power hybrid microwave devices; thermal control; Electromagnetic heating; Microstrip; Microwave devices; Microwave measurements; Optical films; Optical sensors; Power measurement; Resistors; Temperature control; Thermoelectricity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Precision Electromagnetic Measurements, 1994. Digest., 1994 Conference on
Conference_Location :
Boulder, CO, USA
Print_ISBN :
0-7803-1984-2
Type :
conf
DOI :
10.1109/CPEM.1994.333445
Filename :
333445
Link To Document :
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