DocumentCode :
2188783
Title :
A probabilistic framework for combining multiple classifiers at abstract level
Author :
Kang, Hee-Joong ; Kim, Jin H.
Author_Institution :
Dept. of Comput. Sci., Korea Adv. Inst. of Sci. & Technol., Taejon, South Korea
Volume :
2
fYear :
1997
fDate :
18-20 Aug 1997
Firstpage :
870
Abstract :
Most previous studies assumed that classifiers behave independently. Such an assumption degrades and biases classification performance in the case of adding highly dependent classifiers. In order to overcome such a weakness, one should consider combining multiple classifiers in a probabilistic framework using a Bayesian formalism without the assumption. The probabilistic combination of K classifiers needs a (K+1)st-order probability distribution. However, it as well known that the distribution becomes unmanageable when storing and estimating, even for small K. Chow and Liu (1968) as well as Lewis (1959) proposed a product approximation of a high order distribution with a set of only first-order tree dependencies or second-order distributions. However, if a classifier follows more than one classifier, such a first-order dependency will not be suitable to approximate the high order distribution properly. A probabilistic framework is proposed to identify an optimal product set of kth-order dependencies for an approximation of the (K+1)st-order probability distribution where 1⩽k⩽K, and to combine K decisions by the identified product set using a Bayesian formalism. This framework was experimented and evaluated with a standardized CENPARMI database and showed superior performance when compared to other combination methods
Keywords :
Bayes methods; pattern classification; probability; trees (mathematics); Bayesian formalism; abstract level; classification performance; decisions; first-order tree dependencies; high order distribution; multiple classifier combination; optimal product set; probabilistic framework; probability distribution; product approximation; second-order distributions; standardized CENPARMI database; Artificial intelligence; Bayesian methods; Computer science; Degradation; Frequency; Probability distribution; Voting;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Document Analysis and Recognition, 1997., Proceedings of the Fourth International Conference on
Conference_Location :
Ulm
Print_ISBN :
0-8186-7898-4
Type :
conf
DOI :
10.1109/ICDAR.1997.620636
Filename :
620636
Link To Document :
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