• DocumentCode
    2188797
  • Title

    Effects of die-attach materials on the optical durability and thermal performances of HP-LED

  • Author

    Yin, Luqiao ; Yang, Lianqiao ; Xu, Guangming ; Yan, Huafeng ; Chen, Yu ; Yang, Weiqiao ; ShuZhi Li ; Zhang, Jianhua

  • Author_Institution
    Key Lab. of Adv. Display & Syst. Applic., Shanghai Univ., Shanghai, China
  • fYear
    2011
  • fDate
    8-11 Aug. 2011
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Die interconnection layer is one of the main factors to improve the HP-LED thermal issue as it is the main thermal transfer media from the HP-LED chip to the substrate or heat sink. Silver epoxy is now widely used for LED interconnection, but it becomes more and more difficult for efficient heat dissipation as the HP-LED electric power density becomes higher and higher. Nowadays more and more attentions have been moved to metallic eutectic interconnection, especially for solder paste and AuSn20 eutectic interconnection which have big potential to be used for HP-LED. In order to further understand the thermal characteristics and reliability of HP-LED interconnected by different die-attach materials, the AuSn20 eutectic, solder paste and silver epoxy were applied to HP-LED respectively. The transient thermal resistance, steady state junction temperature and optical durability of the HP-LEDs are tested and studied. For HP-LED interconnected by AuSn20 eutectic, solder paste and silver epoxy, when applied 450 mA working current, the transient thermal resistance of die attach layer are 2.5 K/W, 3.2 K/W and 4 K/W respectively, and the junction temperature variation are 0.4%, 9.6% and 6.6% respectively after about 1180 hours 85°C/85 H aging. The results show the AuSn20 eutectic has better thermal performances and optical durability than the solder paste and silver epoxy.
  • Keywords
    cooling; eutectic alloys; gold alloys; light emitting diodes; microassembling; solders; thermal resistance; tin alloys; AuSn; HP-LED chip thermal issue; HP-LED electric power density; HP-LED reliability; current 450 mA; die interconnection layer; die-attach material effect; eutectic interconnection; heat dissipation; optical durability; silver epoxy; solder paste; steady state junction temperature; temperature 85 degC; thermal transfer media; transient thermal resistance; Junctions; Materials; Microassembly; Silver; Thermal resistance; Transient analysis; Die-attach materials; HP-LED; Thermal resistance; optical durability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology and High Density Packaging (ICEPT-HDP), 2011 12th International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-4577-1770-3
  • Electronic_ISBN
    978-1-4577-1768-0
  • Type

    conf

  • DOI
    10.1109/ICEPT.2011.6067023
  • Filename
    6067023