DocumentCode :
2189044
Title :
Managing leakage for transient data: decay and quasi-static 4T memory cells
Author :
Hu, Zhigang ; Juang, Philo ; Diodato, Phil ; Kaxiras, Stefanos ; Skadron, Kevin ; Martonos, Margaret ; Clark, Douglas W.
Author_Institution :
Princeton Univ., NJ, USA
fYear :
2002
fDate :
2002
Firstpage :
52
Lastpage :
55
Abstract :
Much on-chip storage is devoted to transient, often short-lived, data. Despite this, virtually all on-chip array structures use six-transistor (6T) static RAM cells that store data indefinitely. In this paper we propose the use of quasi-static four-transistor (4T) RAM cells. Quasi-static 4T cells provide both energy and area savings. These cells have no connection to Vdd and thus inherently provide decay functionality: values are refreshed upon access but discharge over time without use. This makes 4T cells uniquely well-suited for predictive structures like branch predictors and BTBs where data integrity is not essential. We use quantitative evaluations (both circuit-level and cycle-level) to explore the design space and quantify the opportunities. Overall, 4T-based branch predictors offer 12-33% area savings and 60-80% leakage savings with minimal performance impact. More broadly, this paper suggests a new view of how to support transient data in power-aware processors.
Keywords :
CMOS digital integrated circuits; cache storage; integrated circuit design; low-power electronics; microprocessor chips; random-access storage; CMOS; CPUs; area savings; branch predictors; decay functionality; design space; leakage savings; on-chip storage; power-aware processors; predictive structures; quasi-static four-transistor RAM cells; transient data; Circuits; Fabrication; Hardware; Memory management; Permission; Random access memory; Read-write memory; Space exploration; System-on-a-chip; Threshold voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Low Power Electronics and Design, 2002. ISLPED '02. Proceedings of the 2002 International Symposium on
Print_ISBN :
1-5811-3475-4
Type :
conf
DOI :
10.1109/LPE.2002.146708
Filename :
1029534
Link To Document :
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