DocumentCode :
2189062
Title :
Complementary classifier design using difference principal components
Author :
Kawatani, Takahiko ; Shimizu, Hiroyuki
Author_Institution :
Hewlett-Packard Labs., Kanagawa, Japan
Volume :
2
fYear :
1997
fDate :
18-20 Aug 1997
Firstpage :
875
Abstract :
In classifier combination, the degree of recognition accuracy improvement depends not only on how to combine classifiers, but also on how much classifiers complement each other. In order to improve accuracy, therefore, it is important to design complementary classifiers with respect to each other. The authors propose a method to design a classifier complementary to an existent one, which satisfies the requirements: (a) it can recognize patterns misrecognized by the existent classifier with high accuracy, and (b) the number of patterns which are correctly recognized by the existent classifier but turn out to be misrecognized after combination can be minimized. In the proposed method, features are obtained by projection of original features onto axes such that the scatter of projection of patterns of a given class is small and that the squared mean of projection of patterns misrecognized in the given class is large. As the discriminant function, Fisher´s linear discriminant function is applied using not only linear terms but also quadratic terms. Through experiments using handwritten numeral data included in the NIST database, it has been confirmed that the requirements mentioned above are satisfied. The misrecognition rate reduce to 56% for training data and to 86% for test data
Keywords :
feature extraction; pattern classification; NIST database; complementary classifier design; difference principal components; discriminant function; handwritten numeral data; linear discriminant function; linear terms; misrecognized patterns; original feature projection; pattern projection scatter; quadratic terms; recognition accuracy; test data; training data; Databases; Decision making; Design methodology; Laboratories; Linear discriminant analysis; NIST; Pattern recognition; Scattering; Testing; Training data;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Document Analysis and Recognition, 1997., Proceedings of the Fourth International Conference on
Conference_Location :
Ulm
Print_ISBN :
0-8186-7898-4
Type :
conf
DOI :
10.1109/ICDAR.1997.620637
Filename :
620637
Link To Document :
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