Title :
Car detection from high-resolution aerial imagery using multiple features
Author :
Shao, Wen ; Yang, Wen ; Liu, Gang ; Liu, Jie
Author_Institution :
Sch. of Electron. Inf., Wuhan Univ., Wuhan, China
Abstract :
Detecting cars in high-resolution aerial images has attracted particular attention in recent years. However, scene complexity, large illumination change and occlusions make the task very challenging. In this paper, we propose a robust and effective framework for car detection from high-resolution aerial imagery. More specifically, we first incorporate multiple diverse and complementary image descriptors, Histogram of Oriented Gradients (HOG), Local Binary Pattern (LBP) and Opponent Histogram. Subsequently taking computational efficiency and runtime complexity into account, we adopt an interactive bootstrapping approach to collect hard negatives for training an intersection kernel support vector machine (IKSVM). After training, detection is performed by exhaustive search. Finally for post-processing, we employ a greedy procedure for eliminating repetitive detections via non-maximum suppression. Furthermore, contextual information is utilized to refine the detections. Experimental results on Vaihingen dataset have demonstrated that the proposed method can achieve state-of-the-art performance in various real scenes.
Keywords :
bootstrap circuits; bootstrapping; greedy algorithms; object detection; operating system kernels; support vector machines; Vaihingen dataset; car detection; contextual information; greedy procedure; high-resolution aerial imagery; image descriptors; interactive bootstrapping; intersection kernel support vector machine; local binary pattern; multiple features; nonmaximum suppression; opponent histogram; runtime complexity; scene complexity; state-of-the-art performance; Detectors; Feature extraction; Histograms; Image color analysis; Kernel; Support vector machines; Training; Aerial Imagery; Car Detection; IKSVM; post-processing;
Conference_Titel :
Geoscience and Remote Sensing Symposium (IGARSS), 2012 IEEE International
Conference_Location :
Munich
Print_ISBN :
978-1-4673-1160-1
Electronic_ISBN :
2153-6996
DOI :
10.1109/IGARSS.2012.6350403